February 24, 2022
|
Product
How Does SEM Imaging Work?
At the forefront of nanotechnology, RAITH proudly introduces the IONMASTER, a state-of-the-art, high-resolution analytical ion microscope with unmatched nanofabrication capabilities. This groundbreaking instrument is designed to redefine the boundaries of advanced materials characterization.
In the field of nanoscopic materials science, precise lateral resolution and sensitivity are critical for studying materials and their transformations in three dimensions. The IONMASTER excels in this area by combining a liquid metal alloy ion source (LMAIS) with a magnetic sector SIMS unit and a laser interferometer stage. This integration enables correlative high-resolution 2D/3D imaging, nano-analytics and advanced nanofabrication.
You are currently viewing a placeholder content from Default. To access the actual content, click the button below. Please note that doing so will share data with third-party providers.
More InformationSchematic working principle of the IONMASTER with MagSIMS, IonSelect and UltraPositioning.
The versatile LMAIS technology emits multiple ion species simultaneously, providing unmatched flexibility in selecting primary ions tailored to specific applications. This capability enhances high-resolution secondary electron (SE) imaging, providing stunning surface detail with light primary ions. It also allows precise control of sputter yield and resolution for SIMS analysis, ensuring superior nanofabrication and sample modification.
Known for using energetic primary ions to sputter surfaces and generate secondary ions for chemical analysis, SIMS technology offers exceptional sensitivity and dynamic range. Its multiple modes of analysis - including mass spectrum recording, depth profiling, and 2D/3D imaging - provide comprehensive insight into diverse fields such as materials science, semiconductors, geology, and biology.
Key features of the SIMS system include:
- Advanced secondary ion extraction and transfer optics designed for maximum extraction efficiency and transmission, resulting in unparalleled sensitivity.
- A compact, floating, double-focusing magnetic sector mass spectrometer that operates in DC mode with high transmission, eliminating secondary ion losses common to TOF systemss.
- A focal plane detection system capable of detecting all masses in parallel.
- Easy polarity switching for detection of both positive and negative secondary ions.
The perfect tool for ion microscopy and SIMS analysis
Mouse gut cells with nanoparticles: Aluminum nanoparticles (red) are clearly detected and resolved outside the cells, showing distribution around the cell body
Ion induced SE image with SIMS information of a Rubidium (Rb) einriched CIGS solar cell. The correlation of the signals reveals that Rb is clearly segregated in teh grain boundaries
Positive SIMS signal of the 12C-12C molecules visualizing the polystyrene phase.
The new IONMASTER promises:
- Unmatched resolution and sensitivity
- Fastest time to results
- Next level nanotechnology applications
Experience the future of nanotechnology with IONMASTER, where cutting-edge innovation meets unparalleled precision and join our webinars to learn more about this new exciting instrument!
