FIB systems serve a wide range of applications and possibilities. From nanofabrication to imaging and analysis, they are utilized in almost every research area.
Focused Ion Beams (FIB) enable precise material removal and modification at the nanoscale, vital for device fabrication and nanofabrication. Secondary Ion Mass Spectrometry (SIMS) offers unparalleled sensitivity for elemental and isotopic analysis, crucial in geology and life sciences. Ion imaging techniques provide detailed spatial information for surface analysis and 3D imaging in biological samples. Together, these technologies drive innovation in diverse disciplines, advancing research and development.
Direct patterning
Sample functionalization
2D ion imaging
3D reconstruction
SIMS nanoanalysis
Dive into the fascinating opportunities of focused ion beams
3D ion microscopy
1:34 min Video
VELION – FIB-SEM beyond limits
0:42 min Video
Your applications categories
Transforming industries with cutting-edge applications
It should be no surprise that we are not able to share project details here. Suffice to say that we’re proud of the work we did with some well-known global tech leaders and leading scientific institutions.
VELION at Universität Münster, Prof. Dr. Wolfram Pernice
“We have already been using a RAITH EBPG and an ELPHY on a FIB-SEM microscope for years and were always satisfied with the performance and ease of use of the systems. With VELION, Raith now offers […]
VELION at the University of California, Santa Barbara, Dr. Dan Read
I have been working with RAITH and their products for over 20 years at four different research-intensive universities in both the US and Europe. I have always enjoyed my interactions with RAITH […]
