Introduction
Decoding Materials: The Key Role of Analysis in Advancing Science and Industry
Material analysis involves examining the composition, structure, and properties of substances to understand their behavior and suitability for specific applications. Techniques like spectroscopy or microscopy are used to identify elements, measure purity, and assess mechanical characteristics. Material analysis is crucial in both research environment and industry, ensuring quality control and facilitating research and development efforts. Accurate analysis enables informed decision-making and innovation in materials science.
Application
Nanoparticles
Nanoparticles are tiny particles with dimensions typically ranging from 1 to 100 nanometers. They exhibit unique properties due to their small size, such as high surface area-to-volume ratio and quantum effects. Nanoparticles can be made from various materials including metals, metal oxides, and polymers. They find applications in diverse fields like medicine (drug delivery, imaging), electronics (semiconductors), and environmental remediation (catalysis, water purification). Controlled synthesis methods allow tailoring of nanoparticle size, shape, and surface properties, influencing their behavior and applications. Research continues to explore novel nanoparticle-based technologies for advancing healthcare, electronics, and sustainability initiatives.
Mouse gut cells with nanoparticles. Aluminium nanoparticles (red) are clearly detected and resolved outside the cells showing the distribution around the cell body.
150 nm gate in PMMA (bi-layer)
Freestanding multi-terminal graphene device M. Kühne, MPI Stuttgart, Germany
Application
EDX analysis
EDX analysis (Energy-Dispersive X-ray Spectroscopy) is a technique used to identify the elemental composition of materials. It works by bombarding a sample with high-energy electrons, which causes the emission of characteristic X-rays from the atoms in the sample. The emitted X-rays are then detected and analyzed to determine the elements present and their relative abundance. EDX analysis is widely used in materials science, geology, metallurgy, and biology to study the chemical composition of samples at the microscale or nanoscale. It provides valuable information about material properties, aiding in research, quality control, and forensic investigations.
EDX spectrum of LaAlO3 single crystal (100) with twins NdNiO3 (15nm) + 5 nm BaTiO3
EDX image of a semiconductor device (courtesy of EMFT Fraunhofer Munich, Germany)
Associated cross-section of the same semiconductor device (courtesy of EMFT Fraunhofer Munich, Germany)
Application
In-situ electrical probing
In-situ electrical probing is a technique used to study the electrical properties of materials or devices under real-time conditions. It involves integrating electrical measurement capabilities directly into experimental setups, allowing researchers to monitor changes in conductivity, resistance, or other electrical parameters during experiments or processes. This approach provides valuable insights into material behavior under specific conditions, such as temperature, pressure, or chemical exposure. In-situ electrical probing is widely used in semiconductor device characterization, battery research, and nanomaterial studies. It enables researchers to optimize device performance, diagnose issues, and advance understanding of electrical phenomena at the micro- or nanoscale.
Nanoprobing of freely suspended Pt-nanowire, deposited on gold contact pads with EBID
150 nm gate in PMMA (bi-layer)
Freestanding multi-terminal graphene device M. Kühne, MPI Stuttgart, Germany
Application
TEM lamellae prep
Transmission Electron Microscopy (TEM) and Scanning Transmission Electron Microscopy (STEM) are powerful techniques for materials characterization at the atomic scale. High quality TEM lamellae are crucial for high-resolution TEM characterization. A multi-ion-species FIB-SEM system improves control and flexibility in creating TEM lamellae. By matching the ion species to the characteristics of the sample, the milling process can be optimized, ultimately improving the quality of TEM investigations and expanding the technique to a wider range of materials.
Image of a final TEM lamella after polishing and low kV cleaning
Atomic resolution images of a TEM lamella
Atomic resolution STEM-EDS mapping. Al and La atom columns in the LAO substrate can be clearly distinguished.
Are you interested in more details and insights?
Application Note: Advanced gallium-free TEM lamella preparation using VELION FIB-SEM (.pdf)
High quality TEM lamellae are crucial for high-resolution TEM characterization. Using a vertical FIB column with multiple ion species for TEM sample prep yields many advantages. ThIs application note highlights how to use VELION’s unique features to advance the quality of TEM investigations and to optimize TEM lamella prep for a wider range of materials.
Application
Tomography / mill & image
Light and heavy ions are applied alternately for 3D ion microscopy while maintaining the top-down FIB geometry without sample tilt. Appropriate milling strategies are effectively employed to ensure smooth and uniform delayering of the sample while milling the substrate. Intermittent scanning ion microscopy delivers high-resolution images between respective milling steps, which can then be combined for a 3D nano-reconstruction of the sample.
Analysis of a CIGS solar cell: Obtaining data by mill and image of a certain region of interest (ROI). Field of view 20 µm x 20 µm
Close up of the ROI (10 µm x 10 µm). Depth 500 nm
3D reconstruction of the region of interest